The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2010

Filed:

Feb. 01, 2006
Applicants:

Makiko Kan, Tokyo, JP;

Toshiyuki Miyauchi, Tokyo, JP;

Inventors:

Makiko Kan, Tokyo, JP;

Toshiyuki Miyauchi, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A decoding apparatus and method is disclosed by which the decoder error occurrence probability is suppressed and a high decoding performance can be achieved. An ABP decoding apparatus diagonalizes a parity check matrix, updates LLR values, decodes the LLR values and then adds a decoded word obtained by the decoding to a decoded word list. The ABP decoding apparatus repeats the decoding procedure as inner repetitive decoding by a predetermined number of times. Further, as the ABP decoding apparatus successively changes initial values for priority ranks of the LLR values, it repeats the inner repetitive decoding as outer repetitive decoding by a predetermined number of times. Then, the ABP decoding apparatus selects an optimum one of the decoded words from within a decoded word list obtained by the repeated inner repetitive decoding. The invention is applied to an error correction system.


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