The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Mar. 24, 2005
Giovanni Lorenzo Thione, San Francisco, CA (US);
Martin Henk Van Den Berg, Palo Alto, CA (US);
Giovanni Lorenzo Thione, San Francisco, CA (US);
Martin Henk Van Den Berg, Palo Alto, CA (US);
Fuji Xerox Co., Ltd., , JP;
Abstract
Techniques are provided to determine service data features from an archive of web service transactions. Data features for functionally identical classes of service are determined. Differentiating data feature patterns uniquely identifying each service within the class are learned using machine learning, clustering, statistical analysis and the like. A service map associating services with the differentiating patterns is determined. The service map contains data feature patterns that differentiate among otherwise functionally identical services. The data features are optionally associated with past usage, objective and subjective service quality measurements and the like. The data features of the received service requests are compared to differentiating patterns in the service map. The service associated with the differentiating patterns matching the data features of the service request is selected. The data features of the service request may include, but document language, document genre, number of words or characters, type of images, subject matter of images and the like.