The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Jun. 15, 2006
Jonathan Paul Fuge, Bristol, GB;
Michael John Wooldridge, Stroud, GB;
Jamie John Buckingham, Berkeley, GB;
Peter Kenneth Hellier, North Nibley, GB;
Jonathan Paul Fuge, Bristol, GB;
Michael John Wooldridge, Stroud, GB;
Jamie John Buckingham, Berkeley, GB;
Peter Kenneth Hellier, North Nibley, GB;
Renishaw PLC, Wotton-Under-Edge, GB;
Abstract
A dimensional measurement probe () is mounted in a machine tool (), which reorientates the probe about at least one axis A. Strain gauges () sense when a stylus () of the probe contacts a workpiece (), to produce a trigger signal. False trigger signals may be produced when the probe is reorientated. To overcome this, the reorientation is detected by monitoring changes in the fluctuations of the strain gauge outputs, caused by vibrations of the stylus.