The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2010

Filed:

May. 18, 2006
Applicants:

Akira Watanabe, Okayama, JP;

Tadashi Okuno, Okayama, JP;

Hiroshi Tsugita, Okayama, JP;

Tetsumi Sumiyoshi, Tokyo, JP;

Hitoshi Sekita, Tokyo, JP;

Inventors:

Akira Watanabe, Okayama, JP;

Tadashi Okuno, Okayama, JP;

Hiroshi Tsugita, Okayama, JP;

Tetsumi Sumiyoshi, Tokyo, JP;

Hitoshi Sekita, Tokyo, JP;

Assignee:

Cyber Laser Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/44 (2006.01); G01B 3/52 (2006.01); G01B 5/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A problem diagnosis method and problem repair method for a laser device are provided. The method includes measuring the intensity of scattered light generated by an optical part inside the laser device; referring to data indicating a temporal change in the scattered light predicted under predetermined operating conditions of the laser device, and predicting the seriousness of the problem from the intensity of scattered light; and determining what kind of maintenance work is necessary based on the seriousness of the problem. Additionally, the seriousness of the problem in the optical part can be predicted by executing fuzzy logic based on membership functions defining the relationship between scattered light intensity and the seriousness of problems of optical parts.


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