The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Apr. 28, 2006
Johan U. Backstrom, Vancouver, CA;
Junqiang Fan, Vancouver, CA;
Pengling He, New Westminister, CA;
Gregory E. Stewart, Vancouver, CA;
Johan U. Backstrom, Vancouver, CA;
Junqiang Fan, Vancouver, CA;
Pengling He, New Westminister, CA;
Gregory E. Stewart, Vancouver, CA;
Honeywell ASCA Inc., Ontario, CA;
Abstract
A method includes predicting measurements or states to be used by a controller to control a process. The predicted measurements or states are generated using a model of the process. The method also includes providing the predicted measurements or states to the controller such that the controller uses the predicted measurements or states at a sampling rate of the controller. In addition, the method includes updating at least some of the predicted measurements or states using measurements associated with a characteristic of an item from a sensor. The model may represent a discrete time model, and the method may also include generating the discrete time model using a continuous time model of the process. The measurements could be received from a plurality of sensors, where at least two of the sensors have different sampling times.