The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Jul. 08, 2004
Gunnar Krüger, Erlangen, DE;
Stefan Thesen, Erlangen, DE;
Gunnar Krüger, Erlangen, DE;
Stefan Thesen, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In the examination of a subject with a magnetic resonance tomography apparatus, data for a slice of the subject to be examined are obtained with a sequence of a fast MRT imaging method that includes at least three phase correction scans and measurement signals of the respective phase correction scans as well as of the slice are obtained. The phase difference of corresponding data points of two phase correction scans are calculated point-by-point, the average phase difference between the phase correction scans is evaluated, and the frequency offset between the actual resonance frequency relative to the adjusted resonance frequency is calculated based on the average phase difference and the echo time difference between the phase correction scans used. A Bfield map is calculated dependent on the frequency offset and, the measurement data for the slice are corrected using the calculated Bfield map.