The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Aug. 29, 2006
Raj Shekhar, Elkridge, MD (US);
Vladimir Zagrodsky, North Rovalton, OH (US);
Vivek Walimbe, Waukesha, WI (US);
Raj Shekhar, Elkridge, MD (US);
Vladimir Zagrodsky, North Rovalton, OH (US);
Vivek Walimbe, Waukesha, WI (US);
University of Maryland, Baltimore, Baltimore, MD (US);
Abstract
Techniques for segmenting data include receiving reference segmentation data and target data. The reference segmentation data defines a mesh indicating a boundary of a physical component in a reference body. The target data includes measured values at coordinates within a target body. Coordinates for vertices of the mesh are moved toward nearby edges in values of the target data. The adjustment also may be based on deviations from adjacent vertices or from a three dimensional generalized gradient vector field. The mesh may be initially transformed by a particular transformation that automatically maximizes a similarity measure between the target data and reference data. The reference data includes measured values within the reference body. The reference segmentation also may define a second mesh that indicates a second boundary in the reference body, and the adjustment is also based on an adjusted distance between the mesh and the second mesh.