The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Dec. 29, 2006
Eric Jonathan Bauer, Freehold, NJ (US);
Paul Hampton Franklin, Colts Neck, NJ (US);
David A. Gatenby, Monmouth Beach, NJ (US);
Meenakshi Sharma, Bethlehem, PA (US);
Eric Jonathan Bauer, Freehold, NJ (US);
Paul Hampton Franklin, Colts Neck, NJ (US);
David A. Gatenby, Monmouth Beach, NJ (US);
Meenakshi Sharma, Bethlehem, PA (US);
Alcatel-Lucent USA Inc., Murray Hill, NJ (US);
Abstract
The invention includes a method and apparatus for assessing an available version of a sourced element. The method includes obtaining a description of an available version of the sourced element, identifying a plurality of evaluation items for the sourced element by evaluating the description using at least one evaluation category including a plurality of evaluation parameters, and determining an overall assessment of the available version of the sourced element using the identified evaluation items for the sourced element. The overall assessment is indicative of a value associated with the available version of the sourced element. The method may further include generating overall assessments of other available versions of a sourced element or generating overall assessments of available versions of other sourced elements, and prioritizing the available versions of the sourced elements using the overall assessments of the available versions of the sourced elements.