The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Jun. 27, 2007
Applicant:
Sung-joo Ha, Gyeonggi-do, KR;
Inventor:
Sung-Joo Ha, Gyeonggi-do, KR;
Assignee:
Hynix Semiconductor Inc., Gyeonggi-do, KR;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test signal generating apparatus for a semiconductor integrated circuit includes a fuse control unit that generates a plurality of fuse enable signals in response to a clock and a power-up signal, and a plurality of test mode fuses that individually output test mode fuse signals so as to generate test signals in response to the fuse enable signals after a test mode is completed.
Ha, Sung-Joo. (2010). Apparatus and method for generating test signals after a test mode is completed (U.S. Patent No. 7688657). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7688657
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