The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7688637 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 30, 2010

Filed:

Apr. 25, 2007
Applicant:

Kazuki Yoshioka, Osaka, JP;

Inventor:

Kazuki Yoshioka, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a semiconductor device, a self-test circuit includes a write part for writing data in a given address of a special region of a nonvolatile memory; a read part for reading the written data from the given address; a verify part for determining whether or not the written data accords with the read data; and a decision part for determining soundness of the nonvolatile memory on the basis of a result of determination made by the verify part. In the case where the written data accords with the read data, the decision part determines that the nonvolatile memory is sound, and in the case where the data do not accord with each other, it determines that the nonvolatile memory is unsound.


Find Patent Forward Citations

Yoshioka, Kazuki. (2010). Memory self-test circuit, semiconductor device and ic card including the same, and memory self-test method (U.S. Patent No. 7688637). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7688637

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