The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Sep. 19, 2007
Shigeo Kittaka, Tokyo, JP;
Kentaro Yamada, Tokyo, JP;
Tatsuhiro Nakazawa, Tokyo, JP;
Keiji Tsunetomo, Tokyo, JP;
Shigeo Kittaka, Tokyo, JP;
Kentaro Yamada, Tokyo, JP;
Tatsuhiro Nakazawa, Tokyo, JP;
Keiji Tsunetomo, Tokyo, JP;
Nippon Sheet Glass Company, Limited, Tokyo, JP;
Abstract
A transmissive diffraction grating includes a substrate and a plurality of ridges provided in a mutually parallel manner at constant periodicity p on the substrate. The ridges include a first layer, a second layer (refractive index n: 2.0-2.5), and a third layer with non-continuous refractive indices, arranged in that order from the substrate outward. The first layer adjacent the substrate, in terms of its refractive index, exhibits a difference of 0.1 or less relative to the substrate. The second layer has a higher refractive index than the first layer and third layer and satisfies the following conditions. For a single ridge, the cross-sectional area S of a cross-section of the second layer perpendicular to the longitudinal direction of said ridge is in the range of 0.75pkθ/(n−1)<S<1.20pkθ/(n−1), were, θ is the angle of incidence onto the diffraction grating face, expressed in radian units, and the constant kis 1.1. The thickness dof the second layer is in the range of 0.70pkθn/(n−1)<d<1.30pkθn/(n−1), where, the constant kis 0.69.