The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2010

Filed:

Mar. 30, 2006
Applicants:

Manuel Hertter, Munich, DE;

Joerg Hoeschele, Meckenbeuren-Brochenzell, DE;

Stefan Schneiderbanger, Lauterbach, DE;

Juergen Steinwandel, Uhldingen-Muehlhofen, DE;

Inventors:

Manuel Hertter, Munich, DE;

Joerg Hoeschele, Meckenbeuren-Brochenzell, DE;

Stefan Schneiderbanger, Lauterbach, DE;

Juergen Steinwandel, Uhldingen-Muehlhofen, DE;

Assignee:

MTU Aero Engines GmbH, Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An arrangement for measuring characteristic properties of a plasma beam in a thermal spray process, including a device for introducing spray materials into the plasma, a one-dimensional or two-dimensional array including first optical waveguides for receiving the light radiation emitted by the plasma, and other optical waveguides for distributing the light radiation emitted by the plasma. A device is provided for splitting the light guided in the first optical waveguides into the other optical wave guides, one optical waveguide being connected to the opening diaphragm of a particle flow arrangement, and the other optical waveguide being connected to the opening diaphragm of a spectrometer. A device is also provided for determining the current state of the spray process.


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