The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7688439 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 30, 2010

Filed:

Jul. 11, 2007
Applicants:

Shu-hui Tsai, Hsinchu County, TW;

Shiow-harn Lee, Hsinchu, TW;

Inventors:

Shu-Hui Tsai, Hsinchu County, TW;

Shiow-Harn Lee, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/10 (2006.01); G01B 9/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical measuring system includes a carrying tray for carrying a specimen, a first light source module, a second light source module and an optical measuring module. The first light source module is disposed at the first side of the carrying tray and the specimen is disposed on the optical path of the first light source module. The second light source module is disposed at the second side of the carrying tray and the specimen is disposed on the optical path of the second light source module. The optical measuring module is disposed at the first side or the second side of the carrying tray, and the specimen is located within the probing range of the optical measuring module.


Find Patent Forward Citations

Tsai, Shu-Hui. (2010). Optical measuring system (U.S. Patent No. 7688439). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7688439

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