The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2010

Filed:

Mar. 03, 2008
Applicant:

Mikihiro Kajita, Tokyo, JP;

Inventor:

Mikihiro Kajita, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A power supply noise measuring circuit and measuring method are provided which are capable of evaluating a frequency component of power supply noise that affects performance and functions in a circuit by using a cross-correlation function. The power supply noise measuring circuit includes a SIN wave generating circuit which generates a sine wave signal having a variable frequency in a constant amplitude, a cross-correlation processing circuit which calculates and output a cross-correlation function between power supply noise and a sine wave signal fed from the SIN wave generating circuit, a comparator which compares a cross-correlation function output with a specified threshold voltage and which generates an output when the cross-correlation function output exceeds the threshold voltage, and a counter which counts the number of occurrences of the output from the comparator within a specified time of period.


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