The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Jun. 02, 2006
Wolfgang Erdmann, Buxtehude, DE;
Eckehard Zuendorf, Neunkirchen-Seelscheid, DE;
Wolfgang Erdmann, Buxtehude, DE;
Eckehard Zuendorf, Neunkirchen-Seelscheid, DE;
Airbus Deustschland GmbH, , DE;
Abstract
A testing apparatus and a method for detecting a contact deficiency of an electrically conductive connection. The testing apparatus comprises a measuring chamber, in which several system elements of the connection that are connected in an electrically conductive fashion are positioned, a heat radiator that is supplied with energy and the transferred thermal radiation of which is emitted into the measuring chamber and directed toward the region of the system elements that, after having been heated, generate a thermal field of the insulated and the metallic system components of these connected system elements, a thermal (image) acquisition unit for optically capturing the generated thermal field and for realizing a signal conversion into a thermal image of the connected system elements, and a thermal (image) reproduction unit for the visual reproduction of the converted thermal image.