The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Dec. 23, 2002
Probe for electrical measurement methods and use of a flexible probe for production of a rigid probe
Applicants:
Ludwig Bär, Erlangen, DE;
Werner Heinrich, Bärenklau, DE;
Inventors:
Ludwig Bär, Erlangen, DE;
Werner Heinrich, Bärenklau, DE;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01N 27/72 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to a probe for electrical measurements and use of a flexible probe to produce an inflexible probe. Conventional probes comprise a substrate which is mechanically rigid. As a result only planar surfaces may be examined with the probe. According to the invention, a probe is flexibly embodied by means of a flexible substrate such that the probe may be adjusted to match various curvature radii of test bodies.