The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2010

Filed:

Nov. 29, 2005
Applicants:

Hirokuni Fujiyama, Hyogo, JP;

Takashi Morie, Osaka, JP;

Hiroya Ueno, Osaka, JP;

Inventors:

Hirokuni Fujiyama, Hyogo, JP;

Takashi Morie, Osaka, JP;

Hiroya Ueno, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/165 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a filter characteristic adjusting apparatus and a filter characteristic adjusting method which can avoid an increase in circuit scale of the filter characteristic adjusting apparatus, and can speedily adjust a characteristic frequency of the filter to a desired frequency. When performing characteristic adjustment for the filter, the test signal generation unit () generates a test signal (s) which is a pulse signal having the same frequency as the characteristic frequency of the filter () on the basis of a reference signal (s), and a phase-shifted test signal (s') that is obtained by shifting the phase of the test signal (s) by a predetermined amount with a phase shift unit () in a control signal generation unit () is compared with a filter output signal (s) that is obtained by inputting the test signal (s) into the filter () to obtain a phase difference between the signals, and then the phase difference is subjected to a binary search to generate a control signal (s).


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