The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7687855 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 30, 2010

Filed:

Feb. 07, 2005
Applicants:

Akiharu Miyanaga, Kanagawa, JP;

Nobuo Kubo, Kanagawa, JP;

Inventors:

Akiharu Miyanaga, Kanagawa, JP;

Nobuo Kubo, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

To provide a semiconductor device that can effectively suppress the short channel effect without deterioration of carrier migration, an impurity ion is added from a direction of the <110> axis with respect to a silicon substrate on forming a punch through stopper under the gate electrode. In this invention, because the addition of the impurity is conducted by utilizing the principal of channeling, the impurity can be added with a small amount of scattering suppressing damage on the surface of the silicon substrate. A channel forming region having an extremely small impurity concentration and substantially no crystallinity disorder is formed.


Find Patent Forward Citations

Miyanaga, Akiharu. (2010). Semiconductor device having impurity region (U.S. Patent No. 7687855). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7687855

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