The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2010

Filed:

Jan. 19, 2007
Applicants:

Kentaro Indo, Edmonton, CA;

Albert Ballard Andrews, Wilton, CT (US);

Stephane Vannuffelen, Tokyo, JP;

Tsutomu Yamate, Yokohama, JP;

Toru Terabayashi, Sagamihara, JP;

Hideki Kinjo, Sagamihara, JP;

Oliver C. Mullins, Ridgefield, CT (US);

Inventors:

Kentaro Indo, Edmonton, CA;

Albert Ballard Andrews, Wilton, CT (US);

Stephane Vannuffelen, Tokyo, JP;

Tsutomu Yamate, Yokohama, JP;

Toru Terabayashi, Sagamihara, JP;

Hideki Kinjo, Sagamihara, JP;

Oliver C. Mullins, Ridgefield, CT (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 5/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Some principles described herein contemplate implementation of downhole imaging for the characterization of formation fluid samples in situ, as well as during flow through production tubing, including subsea flow lines, for short term investigation, permanent, and/or long term installations. Various methods and apparatus described herein may facilitate downhole testing. For example, some embodiments facilitate multi-dimensional fluorescence spectrum measurement testing downhole.


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