The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Feb. 01, 2006
Kurt Heiberger, Nuremberg, 90455, DE;
Kurt Heiberger, Nuremberg, 90455, DE;
Other;
Abstract
The invention relates to a device for measuring imaging errors in the human eye, wherein substantial scanning of the lens of the eye with a light beam or laser diode determines the measuring accuracy of local refractive power. Measuring accuracy of locally dependent refractive power is achieved by a two-dimensionally refractable tilting mirror which is embodied in the form of a microscanner mirror with the aid of a piezomotor for positioning and by electrically controllable liquid lenses. As a result, it is possible to manufacture the measuring device as small as possible, enabling it to be integrated in to a processing laser in order to monitor the result of treatment with a laser during individual adaptation of contact lenses, intraocular lenses or surgical correction of the retina in situ and to calculate data of a required correction.