The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2010

Filed:

Apr. 25, 2005
Applicants:

Derke R. Hughes, Warwick, RI (US);

Dennis F. Deshamais, Tiverton, RI (US);

Jeffrey T. Feaster, Wakefield, RI (US);

Fletcher A. Blackmon, Forestdale, MA (US);

Inventors:

Derke R. Hughes, Warwick, RI (US);

Dennis F. Deshamais, Tiverton, RI (US);

Jeffrey T. Feaster, Wakefield, RI (US);

Fletcher A. Blackmon, Forestdale, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 7/00 (2006.01); G01H 1/00 (2006.01); G01S 3/80 (2006.01); F41J 5/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A target for a test range includes an impact plate having at least three strain sensors positioned on the plate. The sensors are connected to a data acquisition board for receiving a signal from each sensor upon impact of a projectile on the plate. The data acquisition board is joined to a processor for calculating impact location and energy. Optionally multiple sensors can be provided having different orientations for accounting for different strain components in the plate.


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