The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Aug. 05, 2009
Applicants:

David Chapman, San Jose, CA (US);

Thomas Grebinski, Alamo, CA (US);

Inventors:

David Chapman, San Jose, CA (US);

Thomas Grebinski, Alamo, CA (US);

Assignee:

Oasis Tooling, Inc., Alamo, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

The technology disclosed relates to granular analysis of design data used to prepare chip designs for manufacturing and to identification of similarities and differences among parts of design data files. In particular, it relates to parsing data and organizing into canonical forms, digesting the canonical forms, and comparing digests of design data from different sources, such as designs and libraries of design templates. Organizing the design data into canonical forms generally reduces the sensitivity of data analysis to variations in data that have no functional impact on the design. The details of the granular analysis vary among design languages used to represent aspects of a design. For various design languages, granular analysis includes partitioning design files by header/cell portions, by separate handling of comments, by functionally significant/non-significant data, by whitespace/non-whitespace, and by layer within a unit of design data. The similarities and differences of interest depend on the purpose of the granular analysis. The comparisons are useful in many ways.


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