The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Feb. 01, 2007
Sreeranga P. Rajan, Sunnyvale, CA (US);
Oksana Tkachuk, Palo Alto, CA (US);
Mukul R. Prasad, San Jose, CA (US);
Indradeep Ghosh, San Jose, CA (US);
Sreeranga P. Rajan, Sunnyvale, CA (US);
Oksana Tkachuk, Palo Alto, CA (US);
Mukul R. Prasad, San Jose, CA (US);
Indradeep Ghosh, San Jose, CA (US);
Fujitsu Limited, Kawasaki, JP;
Abstract
A method for detecting software defects includes selecting from a target program comprising a plurality of modules a first module for evaluation and isolating the first module. The method also includes iteratively performing the following steps until the first module has been reduced such that a validation program is able to determine whether the first module contains a defect: generating an environment surrounding the first module, the generated environment preserving at least one external constraint on the first module; reducing the size of the first module; and reducing the number of program states associated with the first module.