The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Sep. 02, 2005
Peter A. Habitz, Hinesberg, VT (US);
Mark R. Lasher, Colchester, VT (US);
William J. Livingstone, Underhill, VT (US);
Peter A. Habitz, Hinesberg, VT (US);
Mark R. Lasher, Colchester, VT (US);
William J. Livingstone, Underhill, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Forming of a statistical model for a set of independently variable parameters for analysis of a circuit design is disclosed. In one embodiment, a method includes establishing a timing model including delay and delay changes due to process parameter variations (Pi) that impact timing; selecting an element of the circuit design that dominates circuit delay in the timing model; determining a delay sensitivity of each of a set of derived process parameters (Vj) for the element that are linear combinations of the process parameter variations (Pi); and selecting only those derived process parameters with a high sensitivity for use in the statistical model. The invention simplifies the statistical model and reduces the number of calculations require for timing analysis. A method of performing a timing analysis using the simplified statistical model is also disclosed.