The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Jun. 13, 2007
Applicant:

Keshan Zou, Missouri City, TX (US);

Inventor:

Keshan Zou, Missouri City, TX (US);

Assignee:

WesternGeco L.L.C., Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method for subsurface exploration. In one implementation, the method may include receiving a gamma value at a subsurface interface, wherein the gamma value is a ratio of Vp/Vs at the subsurface interface. Vp is the average P wave velocity and Vs is the average S wave velocity. The method may further include receiving a converted wave reflection coefficient at the subsurface interface. The converted wave reflection coefficient is a function of a density contrast at the subsurface interface and a shear velocity contrast at the subsurface interface. The method may further include determining a P wave incident angle such that the converted wave reflection coefficient is a function of substantially only the density contrast at the P wave incident angle. The P wave incident angle is referred to herein as θ. The method may further include calculating the density contrast based on the converted wave reflection coefficient at θ.


Find Patent Forward Citations

Loading…