The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Jun. 07, 2004
Applicants:

Alexandre Shvartsburg, Richland, WA (US);

Jon G. Wilkes, Little Rock, AR (US);

Paul Chiarelli, Chicago, IL (US);

Ricky D. Holland, Sheridan, AR (US);

Dan A. Buzatu, Benton, AR (US);

Michael A. Beaudoin, Little Rock, AR (US);

Inventors:

Alexandre Shvartsburg, Richland, WA (US);

Jon G. Wilkes, Little Rock, AR (US);

Paul Chiarelli, Chicago, IL (US);

Ricky D. Holland, Sheridan, AR (US);

Dan A. Buzatu, Benton, AR (US);

Michael A. Beaudoin, Little Rock, AR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for reproducibly analyzing mass spectra from different sample sources is provided. The method deconvolutes the complex spectra by collapsing multiple peaks of different molecular mass that originate from the same molecular fragment into a single peak. The differences in molecular mass are apparent differences caused by different charge states of the fragment and/or different metal ion adducts and/or reactant products of one or more of the charge states. The deconvoluted spectrum is compared to a library of mass spectra acquired from samples of known identity to unambiguously determine the identity of one or more components of the sample undergoing analysis.


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