The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Dec. 07, 2006
Juha Virtanen, Helsinki, FI;
Borje Rantala, Helsinki, FI;
Seppo Iikka Juhani Virtanen, Helsinki, FI;
Juha Virtanen, Helsinki, FI;
Borje Rantala, Helsinki, FI;
Seppo Iikka Juhani Virtanen, Helsinki, FI;
General Electric Company, Schenectady, NY (US);
Abstract
The invention relates to a method and apparatus for detecting artifacts in a bioelectric signal, especially in a frontal EEG signal. In order to accomplish an uncomplicated mechanism for detecting artifacts in clinical applications, an impedance signal is measured through a first electrode set attached to the skin surface in a measurement area of a patient's body, the impedance signal being indicative of the impedance of the signal path formed between individual electrodes of the set. Simultaneously with the impedance measurement, a bioelectric signal is acquired through a second electrode set also attached to the skin surface of the measurement area, and the time periods are determined during which the impedance signal fulfills at least one predetermined criterion indicative of the presence of artifact in the bioelectric signal. In one embodiment, the first and second electrode sets are formed by a common set of two electrodes.