The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Feb. 23, 2006
Zhaoxi Chen, Plano, TX (US);
Kuen-yu Liu, Plano, TX (US);
Fang Yang, Plano, TX (US);
Song Yang, Allen, TX (US);
Zhaoxi Chen, Plano, TX (US);
Kuen-Yu Liu, Plano, TX (US);
Fang Yang, Plano, TX (US);
Song Yang, Allen, TX (US);
Vistech Corporation, Richardson, TX (US);
Abstract
A tape and reel inspection system is provided with OCR testing of devices, network retrieval of device lot information, and automatic teaching of image patterns. Each device lot is typically accompanied by a travel sheet, which includes a history for the device lot. The travel sheet may include a bar code to allow the system to receive the device lot number while reducing the possibility of human error. The system performs OCR on a first device. The system communicates with a database to obtain lot information. The system combines lot information and package information to form marking information. The system then compares the contents of the markings with line information obtained from the marking information. Once a first device passes the OCR test, the system trains an image of the first device. Image training may be done automatically without intervention from the operator. If a subsequent device fails the image test, the inspection system automatically performs OCR on the failed device.