The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Sep. 29, 2004
Klaus Klingenbeck-regn, Nürnberg, DE;
Klaus Klingenbeck-Regn, Nürnberg, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
An intuitively manageable method for adjusting at least one parameter (X) that determines the image quality of an X-ray image produced by an X-ray device () is provided, wherein, on a user interface () of the X-ray device () a setting zone () for the parameter (X) is shown pictorially, and in relation to the setting zone () the current setting (X) of the parameter (X) is likewise shown pictorially. At least two sub-zones () of the setting zone () are differentiated from each other by color, wherein a first sub-zone () corresponds to a parameter-setting that guarantees good image quality and a second sub-zone () corresponds to a parameter-setting that is critical for the image quality.