The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Mar. 20, 2008
Xiaobing Wang, Beijing, CN;
Yu He, Beijing, CN;
Kun Zhao, Beijing, CN;
Qingjun Zhang, Beijing, CN;
Hua Peng, Beijing, CN;
Xiaobing Wang, Beijing, CN;
Yu He, Beijing, CN;
Kun Zhao, Beijing, CN;
Qingjun Zhang, Beijing, CN;
Hua Peng, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
The present invention relates to the field of radiographic examination and radioactive material inspection, and provides a system and a method capable of simultaneous radiographic examination and radioactive material inspection. The system comprises a radiographic examination system and a radiation monitor; wherein the radiographic examination system comprises an accelerator and a synchronization controller, and the radiation monitor comprises a detector, a front end circuit, a signal transmission controller, a data collecting, analyzing and processing computer, an alarm device and so on. The present invention combines the radiographic examination system and the radiation monitor tightly so that the radioactive material inspection can be executed while the radiographic examination is performed, thereby the examination efficiency is improved and the occupied area of the system is reduced.