The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Aug. 30, 2006
Applicants:

Andy Annadurai, Fremont, CA (US);

Chris Tsu, Saratoga, CA (US);

Feng Han, Pleasanton, CA (US);

Inventors:

Andy Annadurai, Fremont, CA (US);

Chris Tsu, Saratoga, CA (US);

Feng Han, Pleasanton, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 3/06 (2006.01); H04L 12/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and circuitry for detecting a pattern in received data such as the A1A2 boundary in a SONET frame after deserialization. Two consecutive pluralities of bytes of incoming data are stored and compared with the A1 and A2 values (or bit shifted versions of the A1 and A2 values) until the boundary is detected. The data are then bit shifted so that every byte on the bus is either A2 or A1. A new aligned data bus is then formed such that the last A1 bit occurs on the data bus for a given clock cycle and the first A2 bit occurs on the data bus during the next clock cycle.


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