The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Feb. 22, 2006
Applicants:

Sebastien Rolet, Plaisance du Touch, FR;

Capucine Carpentier, Toulouse, FR;

Inventors:

Sebastien Rolet, Plaisance du Touch, FR;

Capucine Carpentier, Toulouse, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 3/80 (2006.01);
U.S. Cl.
CPC ...
Abstract

A standard non-destructive testing probe () may be coupled with a localization system () according to the invention so as to determine the position of the apparatus () on the surface to be analyzed () at any moment. The localization system () comprises an ultrasonic emitter () and two ultrasonic receivers () coupled with means for determining the distance between the emitter () and the receivers (), each of the components being able to be moved freely relative to each other. The coupling between the emitter () and the probe () allows the position of the latter to be determined by triangulation. A localization and mapping method is also described.


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