The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

May. 18, 2007
Applicant:

Yoshio Sakai, Shiki, JP;

Inventor:

Yoshio Sakai, Shiki, JP;

Assignee:

Tanita Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A linear measurement apparatus includes a measuring unit including at least one first noncontact distance measuring sensor and one second noncontact distance measuring sensor supported at a frame and aligned on opposite sides of a measured object. The measuring unit measures a plurality of first gap distances to a plurality of first object positions in a plurality of parallel first measurement lines and a plurality of second gap distances to a plurality of second object positions in a plurality of parallel second measurement lines. A distance calculator calculates a plurality of candidate object lengths on the basis of the first and second gap distances, each candidate object length being a distance between one of the first object positions and one of the second object positions. A maximum selector selects a maximum object length from among the plurality of candidate object lengths.


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