The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Oct. 27, 2006
Applicants:

Thomas E. Drake, Fort Worth, TX (US);

Marc Dubois, Keller, TX (US);

Inventors:

Thomas E. Drake, Fort Worth, TX (US);

Marc Dubois, Keller, TX (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for detecting ultrasonic surface displacements at a remote target are disclosed, one embodiment of the system comprising: a first laser to generate a first laser beam. The first laser beam produces ultrasonic surface displacements on a surface of the remote target. A second laser generates a second laser beam operable to detect the ultrasonic surface displacements on the surface of the remote target and to provide a reference beam to an interferometer. The second laser beam is split, at a beam-splitter, into a pump beam and a probe beam. The pump beam is amplified by a first amplifier and the probe beam is amplified by a second amplifier. The pump beam is then provided to the interferometer as a reference beam and the probe beam is directed to the target to detect the ultrasonic surface displacements. The first and second amplifiers can be controlled independently of one another to control their respective laser beam's power. Collection optics collect phase modulated light from the probe beam either reflected or scattered by the remote target, which can be optionally optically processed to increase the light intensity. The interferometer is a TWM interferometer that receives and processes the phase modulated light and generates at least one output signal based on the phase-modulated light and the amplified reference laser beam.


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