The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Nov. 03, 2004
Applicants:

Jun Keun Chang, Seoul, KR;

Alexey Dan Chin-yu, Seoul, KR;

Jung Kyung Kim, Seoul, KR;

Chanil Chung, Kyunggi-Do, KR;

Sun Hee Lim, Seoul, KR;

Inventors:

Jun Keun Chang, Seoul, KR;

Alexey Dan Chin-Yu, Seoul, KR;

Jung Kyung Kim, Seoul, KR;

Chanil Chung, Kyunggi-Do, KR;

Sun Hee Lim, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a micro particle analyzing device illuminating light to fluid including micro particles, reading the lights emitted from the micro particles at a signal processing reading section and thus analyzing the micro particles. The device comprises a light source section emitting light which will be illuminated to the fluid; a lens regulating an amount and a focal distance of the light emitted from the light source; and a concave mirror condensing light emitted from the micro particle to reflect it to the reading section wherein the concave mirror is formed with a hole so that the light of the light source section having passed through the lens can pass through the concave mirror. When analyzing the micro particles using the analyzing device according to the invention, the amounts of lights emitted from the micro particles according to up-and-down positions of the micro particles are not different.


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