The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Mar. 30, 2006
Christopher Leddy, Huntington Beach, CA (US);
Robert J. Coda, Torrance, CA (US);
Johnny Y. Lee, Aliso Viejo, CA (US);
Stephen R. Nash, Playa del Ray, CA (US);
Christopher Leddy, Huntington Beach, CA (US);
Robert J. Coda, Torrance, CA (US);
Johnny Y. Lee, Aliso Viejo, CA (US);
Stephen R. Nash, Playa del Ray, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
An imaging system and method with an arrangement for sensing the performance of an optical system and providing data in response thereto and electronically correcting nonuniformity in the performance of the optical system in response thereto. In the illustrative application, the nonuniformity is a porthole effect. In the preferred embodiment, the arrangement for correcting includes an arrangement for providing an inverse distortion to an output of the system electronically. The inverse distortion is applied by generating a plurality of spatial correction coefficients from the performance data, storing the coefficients and applying the coefficients to current data from the optical system. The spatial correction coefficients are statistically generated gain and level correction defect maps. The present teachings should enable a correction of optical distortion in nonideal electro-optical systems without requiring additional optics.