The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Jun. 20, 2005
Percy A. Tierney, Seattle, WA (US);
Tuan D. Le, Redmond, WA (US);
Anand Ganesh, Redmond, WA (US);
Adrian Mircea Sima, Pitesti, RO;
Percy A. Tierney, Seattle, WA (US);
Tuan D. Le, Redmond, WA (US);
Anand Ganesh, Redmond, WA (US);
Adrian Mircea Sima, Pitesti, RO;
Microsoft Corporation, Redmond, WA (US);
Abstract
A vertical blanking interval (VBI) signal testing tool captures, isolates, and analyzes a VBI signal to determine the quality of the VBI signal or signal source. A digitized VBI signal may be received and analyzed according to industry standards. The VBI signal is examined using thresholds, threshold points, and other points as a way of discerning waveforms in the signal and their individual characteristics. Thereafter, deviations of the VBI signal from industry standards are logged or displayed for review. One feature of the tool records captured VBI data to a persistent storage medium, thereby allowing post-processing of the VBI signal at another time and/or another location. An exemplary analysis program can read the recorded VBI data from the persistent storage medium and perform tests to determine the quality of the VBI signal or signal source. VBI signal translations are also contemplated.