The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Mar. 17, 2008
Applicants:
Richard Engel, Ridge, NY (US);
Emery Korpi, Syosset, NY (US);
Inventors:
Richard Engel, Ridge, NY (US);
Emery Korpi, Syosset, NY (US);
Assignee:
Advanced Testing Technologies, Inc., Hauppauge, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A distributed test system for implementing enhanced BIT (Built-In-Test) within an ESM (Electronic Surveillance Monitoring) or RF receiver system. The distributed test system includes a system processor, a programmable RF source element or other comparable test signal generating arrangement, and switched path coupled elements and various measurement elements, each embedded at strategic locations within the ESM system so as to effect maximum path coverage and test benefit.