The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Oct. 17, 2007
Applicants:

Katsuki Kiminami, Yokosuka, JP;

Takahiro Iyama, Yokohama, JP;

Teruo Onishi, Yokohama, JP;

Inventors:

Katsuki Kiminami, Yokosuka, JP;

Takahiro Iyama, Yokohama, JP;

Teruo Onishi, Yokohama, JP;

Assignee:

NTT DoCoMo, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A disclosed specific absorption rate measurement system according to an embodiment of the present invention measures a specific absorption rate of electromagnetic waves from a radiating source absorbed in a dielectric medium. The system includes a measurement portion that measures a first electric field vector on an observation surface which is a two-dimensional surface in the dielectric medium; an electric field calculation portion that calculates a second electric field vector in a point excluded from the observation surface in accordance with electric field components of the first electric field vector measured on the observation surface, the electric field components being parallel to the observation surface; and a calculation portion that calculates the specific absorption rate from the calculated second electric field vector.


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