The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Jun. 24, 2004
Yuuichirou Ueno, Hitachi, JP;
Hiroshi Kitaguchi, Naka, JP;
Katsutoshi Tsuchiya, Hitachi, JP;
Kensuke Amemiya, Hitachinaka, JP;
Kazuma Yokoi, Hitachi, JP;
Shinichi Kojima, Hitachi, JP;
Norihito Yanagita, Hitachi, JP;
Takafumi Ishitsu, Hitachi, JP;
Yuuichirou Ueno, Hitachi, JP;
Hiroshi Kitaguchi, Naka, JP;
Katsutoshi Tsuchiya, Hitachi, JP;
Kensuke Amemiya, Hitachinaka, JP;
Kazuma Yokoi, Hitachi, JP;
Shinichi Kojima, Hitachi, JP;
Norihito Yanagita, Hitachi, JP;
Takafumi Ishitsu, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The radiological imaging system which can improve an energy resolution and perform a diagnosis with high accuracy includes a bed for carrying an examinee H, first and second imaging apparatuses and disposed along the longitudinal direction of the bed. The first imaging apparatus has a plurality of semiconductor radiation detectors for detecting γ-rays emitted from the examinee H, arranged around the bed, the second imaging apparatus has an X-ray source for emitting X-rays to the examinee H and a radiation detector for detecting X-rays which have been emitted from the X-ray source and passed through the examinee H, and the bed is shared by the first imaging apparatus and the second imaging apparatus.