The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Jan. 18, 2006
Applicant:

Hisashi Ohtsuka, Kanagawa, JP;

Inventor:

Hisashi Ohtsuka, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/64 (2006.01); G01N 30/96 (2006.01); G01N 21/55 (2006.01); G01J 3/00 (2006.01); C12M 1/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A surface plasmon resonance assay apparatus is loaded with a sensor unit. A sensing surface of a thin film detects reaction of a sample. A dielectric prism is overlaid with the thin film to constitute an interface. A reflection angle upon occurrence of attenuated total reflection of the illuminating light is changeable according to reaction of the sample on the sensing surface. Protecting panels are disposed to face outer surfaces of the prism, for covering and protecting at least partially the outer surfaces. A first window in one of the protecting panels is positioned on a path of the illuminating light traveling for incidence on the interface, for passing the illuminating light. A second window in one remaining protecting panel is positioned on a path of the illuminating light traveling upon reflection by the interface, for passing the illuminating light.


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