The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Oct. 05, 2006
Applicants:

Dehua Yang, Savage, MN (US);

Thomas J. Wyrobek, Edina, MN (US);

Inventors:

Dehua Yang, Savage, MN (US);

Thomas J. Wyrobek, Edina, MN (US);

Assignee:

Hysitron, Incorporated, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

A tensile testing apparatus is provided, and generally includes an X-Y automated stage, and a first specimen holder for holding and transferring force to a specimen to a first portion of a specimen. The first specimen holder is operatively supported by the X-Y automated stage. A Z-automated stage, a multi-function nanotensile transducer head assembly, and a second specimen holder for holding and transferring force to a second portion of the specimen is further provided. The second specimen holder is operatively linked to the Z-automated stage via the nanotensile transducer head assembly. Variable displacement modalities, and non-Z alignment assessment and adjustment are enabled by the multi-function nanotensile transducer head assembly, as well as the X, Y, and Z automated stages.


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