The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Mar. 29, 2005
Applicants:

Wesley David Turner, Rexford, NY (US);

Christopher Allen Nafis, Rexford, NY (US);

Inventors:

Wesley David Turner, Rexford, NY (US);

Christopher Allen Nafis, Rexford, NY (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a multi-mode calibration target operable to calibrate multiple optical sensors. One embodiment has multiple planar surfaces, wherein the multiple planar surfaces are able to be distinguished by visual sensors based on their color, hue, shade, tint, or tone. Additionally, these planar surfaces may be raised or recessed from one another to provide depth contrast as well as visual contrast. Other embodiments may include narrow band emitters such as laser diodes located at predetermined locations within the multi-mode target. These targets may then be used to calibrate various sensors, such as optical sensors, within an inspection system such as a laser ultrasonic inspection system.


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