The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Jun. 06, 2007
Jonathan Paul DE Halleux, Seattle, WA (US);
Nikolai Tillmann, Redmond, WA (US);
Wolfram Schulte, Bellevue, WA (US);
Jonathan Paul de Halleux, Seattle, WA (US);
Nikolai Tillmann, Redmond, WA (US);
Wolfram Schulte, Bellevue, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
In one embodiment a computer system automatically generates unit tests. The computer system accesses a parameterized unit test that provides a base outline from which one or more unit tests are automatically generated, generates input parameter values for a unit of software code, automatically generates a unit test configured to assess the functionality of the unit of software code, and receives test results from a software testing program and provides feedback to a user. In other embodiments, a computer system automatically maintains a unit test database. The computer system receives a unit test at a unit test database, assigns a test identity to the received unit test, determines that the test identity assigned to the received unit test is unique when compared to other unit tests, determines that the received unit test has different functionality coverage characteristics, and adds the received unit test to the unit test database.