The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Feb. 27, 2007
Nathan C. Buck, Underhill, VT (US);
John P. Dubuque, Jericho, VT (US);
Eric A. Foreman, Fairfax, VT (US);
Peter A. Habitz, Hinesburg, VT (US);
Kerim Kalafala, Rhinebeck, NY (US);
Peihua Qi, Wappingers Falls, NY (US);
Chandramouli Visweswariah, Croton-on-Hudson, NY (US);
Xiaoyue Wang, Kanata, CA;
Nathan C. Buck, Underhill, VT (US);
John P. Dubuque, Jericho, VT (US);
Eric A. Foreman, Fairfax, VT (US);
Peter A. Habitz, Hinesburg, VT (US);
Kerim Kalafala, Rhinebeck, NY (US);
Peihua Qi, Wappingers Falls, NY (US);
Chandramouli Visweswariah, Croton-on-Hudson, NY (US);
Xiaoyue Wang, Kanata, CA;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for decreasing processing time in multi-corner static timing analysis. In one embodiment, slack cutoff values are assigned across a parameter process space. For example, a slack cutoff value is assigned to each parameter in a process space by determining an estimated maximum slack change between a starting corner and any other corner in a corresponding process sub-space. In another embodiment, parameters are ordered in a parameter order by decreasing magnitude of impact on variability of timing.