The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Jun. 15, 2007
Adnan Azfar Mahmud, Kirkland, WA (US);
Yingnong Dang, Beijing, CN;
Haidong Zhang, Beijing, CN;
Qiang Wang, Beijing, CN;
Wenli Zhu, Beijing, CN;
Yantao LI, Beijing, CN;
Jian Wang, Beijing, CN;
Adnan Azfar Mahmud, Kirkland, WA (US);
Yingnong Dang, Beijing, CN;
Haidong Zhang, Beijing, CN;
Qiang Wang, Beijing, CN;
Wenli Zhu, Beijing, CN;
Yantao Li, Beijing, CN;
Jian Wang, Beijing, CN;
Microsoft Corporation, Redmond, WA (US);
Abstract
Described is a technology by which software instrumentation data collected during software program usage sessions is analyzed to identify potential problems with software program usage, such as based on frequency of problem occurrence during the usage sessions. Reliability metrics may be calculated from the information. Failure data additionally collected during the usage sessions may be accessed to derive details that correspond to the potential problems. In one example, the information may be analyzed to determine which alerts and/or asserts occurred most often, and/or to determine a relationship between user interface control operations (e.g., clicks and usage of commands) and alerts or asserts.