The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Jun. 15, 2007
Yantao LI, Beijing, CN;
Bing Sun, Beijing, CN;
Shuguang YE, Beijing, CN;
Guowei Liu, Beijing, CN;
Wenli Zhu, Beijing, CN;
Haidong Zhang, Beijing, CN;
Min Wang, Beijing, CN;
Jian Wang, Beijing, CN;
Yantao Li, Beijing, CN;
Bing Sun, Beijing, CN;
Shuguang Ye, Beijing, CN;
Guowei Liu, Beijing, CN;
Wenli Zhu, Beijing, CN;
Haidong Zhang, Beijing, CN;
Min Wang, Beijing, CN;
Jian Wang, Beijing, CN;
Microsoft Corporation, Redmond, WA (US);
Abstract
Described is a technology by which software program feature usage is located within a sequence of commands collected during program usage sessions. For example, feature generally corresponds to a series of commands, such as copy and paste. A visual modeling component is controlled via drag-and-drop operations to describe a feature model, which is then compiled by a compiler into a finite state machine. Noise models may be used to exclude any command in the sequence that is irrelevant to the feature usage. A recognition process uses the finite state machine to locate program feature usage within the sequence of recorded commands by matching command sub-sequences corresponding to the feature model via the state machine. An analyzer may then use the located matches to provide an analysis report on feature usage.