The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2010

Filed:

Apr. 04, 2006
Applicants:

Kadir Kavaklioglu, Eden Prairie, MN (US);

David L. Wehrs, Eden Prairie, MN (US);

Donald Robert Lattimer, Chaska, MN (US);

Evren Eryurek, Melbourne, FL (US);

Inventors:

Kadir Kavaklioglu, Eden Prairie, MN (US);

David L. Wehrs, Eden Prairie, MN (US);

Donald Robert Lattimer, Chaska, MN (US);

Evren Eryurek, Melbourne, FL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 11/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for diagnosing operation of an industrial process control or monitoring system includes an input configured to receive an input related to a process signal. A first statistical parameter module provides a first statistical parameter output related to a statistical parameter of the process signal. A filter provides a filter output related to a filtered value of the process signal. A second statistical parameter module provides a second statistical parameter output related to a statistical parameter of the filter output. A diagnostic module diagnoses operation of the industrial process based upon the first and second statistical parameters.


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