The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2010

Filed:

Aug. 27, 2008
Applicants:

Li-yan Zhu, San Jose, CA (US);

Chao-hui Yang, Milpitas, CA (US);

Yen Fu, San Jose, CA (US);

Ellis T. Cha, San Ramon, CA (US);

Inventors:

Li-Yan Zhu, San Jose, CA (US);

Chao-Hui Yang, Milpitas, CA (US);

Yen Fu, San Jose, CA (US);

Ellis T. Cha, San Ramon, CA (US);

Assignee:

SAE Magnetics (HK) Ltd., Shatin, N.T., HK;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a system and method for a non-contact measurement of the fly height of a slider above a magnetic data storage medium using electrostatic force, a slider with a read/write head flies over a magnetic data storage medium. A series of distinct voltages are applied between the slider and the magnetic data storage medium, and corresponding read-back signals are recorded. Using the recorded read-back signals, coefficients for an empirical curve-fit equation are calculated. The coefficients are normalized and converted into a fly height measurement.


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