The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2010
Filed:
Dec. 09, 2008
Holger Birk, Meckesheim, DE;
Rafael Storz, Bammental, DE;
Holger Birk, Meckesheim, DE;
Rafael Storz, Bammental, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
The arrangement for examining microscope preparations with a scanning microscope comprises a laser () and an optical means () which images the light generated by the laser () onto a specimen () that is to be examined. Provided between the laser () and the optical means () is an optical component () that spectrally spreads, with a single pass, the light generated by the laser (). The optical component () is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile